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Concludes that model SIPS probe acceptable for licensing purposes IAW conditions of encl registration certificate NR-0701-D-104-B.

Accession Number: ML20155C764

Date Released: Monday, October 28, 2024

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• ML20155C761 - Concludes that model SIPS probe acceptable for licensing purposes IAW conditions of encl registration certificate NR-0701-D-104-B. (1 page(s), 10/29/1998)
• ML20155C771 - Responds to 980916 ltr requesting addl info re prototype testing & probe const.Listed responses presented in same order as requests. (2 page(s), 10/12/1998)
• ML20155E280 - Research Rept AUT/TES/729/98, "Mechanical Tests for SIPS 2480 Probe." (8 page(s), 9/28/1998)
• ML20155C777 - Forwards pp entitled, "Instructions in Case of Damage/ Failure of SIPS Probe," to be inserted in user manual under section IV of radiation safety & regulations.Table of contents should also be updated. (2 page(s), 10/20/1998)
• ML20155C783 - Responds to 980603 ltr,requesting addl info & clarifications missing from 981016 application & resubmitted on 980419. Listed info addresses issues in same order as presented in subj ltr. (3 page(s), 6/17/1998)
• ML20155C811 - "SIPS Probe Shock Test." (7 page(s), 2/4/1998)
• ML20155C795 - Responds to 980316 ltr re deficiencies in 981016 application requesting to add model SIPS x-ray probe to certificate NR-701-D-101-B.Forwards missing documentation containing drawings & sub assemblies of SIPS probe re probe operation. (3 page(s), 4/19/1998)
• ML20155C830 - Discusses 980626 telcon requesting more detailed explanation of SIPS probe drop test & wipe tests of sources installed in probe.Amended rept of SIPS probe drop test,provided by factory in Espoo,FL encl. (1 page(s), 7/6/1998)
• ML20155C842 - "SIPS Probe Shock Test." (6 page(s), 3/7/1998)
• ML20155C908 - Responds to 971016 application requesting to add models A3895-1 & A3895-2 sources & model SIPS x-ray fluorescence analyzer probe to registration certificate NR-701-D-101-B. Listed info needed to continue evaluation of SIPS probe. (48 page(s), 3/16/1998)
• ML20155E283 - Rev 2 to, "SIPS Probe for Use With X-MET Model 960,PC Based, Portable X-Ray Fluorescence Analyzer-Details of Operation & Mechanical Const,Per Radiation Safety." (46 page(s), 4/18/1998)
• ML20155C927 - "X-MET2000 Metalmaster User Manual." Formerly referred to as X-MET960. (132 page(s), 10/29/1998)
• ML20155C937 - Rev 1.60 to, "Metorex Intl OY Quality Manual QEI." (62 page(s), 1/20/1997)
• ML20155E290 - Test Rept, "SIPS Shutter Mechanism." (1 page(s), 12/22/1997)